ASTM F77-69(1996)
Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)

Standard No.
ASTM F77-69(1996)
Release Date
2017
Published By
American Society for Testing and Materials (ASTM)
Latest
ASTM F77-69(1996)
Scope
1.1 This test method covers the determination of the apparent density of ceramic parts, used in electron device and semiconductor applications, with a maximum dimension of 25 mm (1 in.) and having zero or discontinuous porosity. 1.2 The values stated in SI units are to be regarded as the standard. The values in parentheses are for information only. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability or regulatory limitations prior to use.

ASTM F77-69(1996) Referenced Document

  • ASTM E29 Standard Practice for Using Significant Digits in Test Data to Determine Conformance with Specifications

ASTM F77-69(1996) history

  • 2017 ASTM F77-69(1996) Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)
Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)



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