EEE Std 1671.1-2017
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions

Standard No.
EEE Std 1671.1-2017
Release Date
2018
Published By
Institute of Electrical and Electronics Engineers (IEEE)
Latest
EEE Std 1671.1-2017
Replace
IEEE Std 1671.1-2009
Scope
An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard.

EEE Std 1671.1-2017 history

  • 2018 EEE Std 1671.1-2017 IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
  • 2009 IEEE Std 1671.1-2009 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

EEE Std 1671.1-2017 IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions has been changed from IEEE Std 1671.1-2009 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions.




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