IEC PAS 62204:2000
Standard method for measuring and using the temperature coefficient of resistance to determine the temperature of a metallization line

Standard No.

IEC PAS 62204:2000

Release Date

1970

Published By

SCC

Latest

IEC PAS 62204:2000

Replace By

IEC PAS 62204:2000

Replace

31.080.01

Scope

Aims at determining the temperature coefficient of resistance (at a given reference temperature) of aluminium and aluminium-alloy thin-film metallization that are used in microelectronic circuits and devices. This method is intended for estimating a mean temperature of a metallization line stressed in an accelerated electromigration stress test before any irreversible change in resistivity occurs due to the current-density and temperature stresses imposed.

IEC PAS 62204:2000 history

• 1970 IEC PAS 62204:2000 Standard method for measuring and using the temperature coefficient of resistance to determine the temperature of a metallization line