BS IEC 62373-1:2020
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Fast BTI test for MOSFET

Standard No.

BS IEC 62373-1:2020

Release Date

2023

Published By

British Standards Institution (BSI)

Latest

BS IEC 62373-1:2020

Scope

1   Scope This part of IEC 62373 provides the measurement procedure for a fast BTI (bias temperature instability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs). This document also defines the terms pertaining to the conventional BTI test method.

BS IEC 62373-1:2020 history

• 2023 BS IEC 62373-1:2020 Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Fast BTI test for MOSFET