JR/T 0045.3-2014
China Financial Integrated Circuit (IC) Card Testing Specifications Part 3: Personalized Testing Specifications for Debit/Credit Applications (English Version)

Standard No.

JR/T 0045.3-2014

Language

Chinese, Available in English version

Release Date

2014

Published By

中国人民银行

Latest

JR/T 0045.3-2014

Replace

JR/T 0045.3-2008

JR/T 0045.3-2014 history

• 2014 JR/T 0045.3-2014 China Financial Integrated Circuit (IC) Card Testing Specifications Part 3: Personalized Testing Specifications for Debit/Credit Applications
• 2008 JR/T 0045.3-2008 China Financial Integrated Circuit (IC) Card Testing Specification Part 3