IEC 62373-1:2020
Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

Standard No.

IEC 62373-1:2020

Release Date

2020

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 62373-1:2020

IEC 62373-1:2020 history

• 2020 IEC 62373-1:2020 Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET