T/CIE 134-2022
Test method for data retention time of magnetic random access memory chip (English Version)

Standard No.

T/CIE 134-2022

Language

Chinese, Available in English version

Release Date

2022

Published By

Group Standards of the People's Republic of China

Latest

T/CIE 134-2022

T/CIE 134-2022 history

• 2022 T/CIE 134-2022 Test method for data retention time of magnetic random access memory chip