SJ/T 10741-2000
Semiconductor integrated circuits General principles of measuring methods for CMOS circuits (English Version)

Standard No.

SJ/T 10741-2000

Language

Chinese, Available in English version

Release Date

2000

Published By

Professional Standard - Electron

Status

Withdraw 2011-08

Latest

SJ/T 10741-2000

Scope

This standard specifies the basic principles of electrical characteristics testing methods for semiconductor integrated circuits CMOS circuits. This standard is suitable for testing the electrical characteristics of CMOS circuits of semiconductor integrated circuits.

SJ/T 10741-2000 history

• 2000 SJ/T 10741-2000 Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
• 1970 SJ/T 10741-1996 Semiconductor integrated circuits--General principles of measuring methods for CMOS circuits