2015SJ/T 2354-2015 Measuring methods for photodiodes of PIN、APD
1983SJ 2354.11-1983 Method of measurement for width of blind zone of PIN and avalanche photodiode matrix
SJ 2354.11-1983 Method of measurement for width of blind zone of PIN and avalanche photodiode matrix was changed to SJ/T 2354-2015 Measuring methods for photodiodes of PIN、APD.