EJ/T 1184-2005
Determination of micro silicon in depleted uranium tetrafluoride by spectrophotometric method (English Version)
- Standard No.
- EJ/T 1184-2005
- Language
- Chinese, Available in English version
- Release Date
- 2005
- Published By
- Professional Standard - Nuclear Industry
- Latest
- EJ/T 1184-2005
- Scope
- This standard specifies the method principle, reagents, instruments, analysis steps, result calculation and method precision for the spectrophotometric determination of trace amounts of silicon in depleted uranium tetrafluoride. This standard is applicable to the determination of trace silicon in depleted uranium tetrafluoride. The determination of trace silicon in uranium tetrafluoride with other abundances can be used as a reference. When the amount taken is 0.25g uranium tetrafluoride, the measurement range of silicon is: (10~120)μg/g. Within the measurement range, 40μg phosphorus and 3μg resistance will not interfere with the determination of silicon.
EJ/T 1184-2005 history
- 2005 EJ/T 1184-2005 Determination of micro silicon in depleted uranium tetrafluoride by spectrophotometric method
