SJ/T 11211-1999
Measurement of quartz crystal unit parameters.Part5:Method for the determination of equivalent electrical parameters using automatic network analyer techniques and error correction (English Version)
- Standard No.
- SJ/T 11211-1999
- Language
- Chinese, Available in English version
- Release Date
- 1999
- Published By
- Professional Standard - Electron
- Latest
- SJ/T 11211-1999
- Scope
- This standard specifies the best expression method for determining quartz crystal resonators using linear equivalent circuits. This representation is based on electrical parameters measured by a vector network analyzer with automatic error correction. The method for determining equivalent electrical parameters in this standard is based on measuring the device impedance near series resonance. This standard does not directly address the further issue of characterizing the parameters of a device operating with a series load capacitance. Although we acknowledge that some applications require this parameter. The same measuring instrument and essentially the same type of measurement provide the means for complete characterization of the parameters of the test load capacitance fixture and the series combination of the load capacitance fixture and the crystal element.
SJ/T 11211-1999 history
- 1999 SJ/T 11211-1999 Measurement of quartz crystal unit parameters.Part5:Method for the determination of equivalent electrical parameters using automatic network analyer techniques and error correction
