SJ/Z 9154.2-1987
Use the zero phase technique in π-network to measure the quartz crystal unit parameters Part 2: Phase offset method for measurement of dynamic capacity of quartz crystal elements (English Version)
- Standard No.
- SJ/Z 9154.2-1987
- Language
- Chinese, Available in English version
- Published By
- Professional Standard - Electron
- Latest
- SJ/Z 9154.2-1987
- Scope
- This standard describes a method for measuring the dynamic capacitance of quartz crystal components from 1 to 125MHz, with a total measurement error of approximately 5%. The advantage of this method is that it only uses the measurement circuit described in the SJ/Z 9154-87 (IEC 444) standard, and No additional parts or instruments are required, which can be a source of error.
SJ/Z 9154.2-1987 history
- 1970 SJ/Z 9154.2-1987 Use the zero phase technique in π-network to measure the quartz crystal unit parameters Part 2: Phase offset method for measurement of dynamic capacity of quartz crystal elements
