SJ/T 10143-1991
Detail specification for electronic components--Semiconductor integrated circuits--CT54LS112/CT74LS112 dual J-K negative-edge flip-flop (English Version)

Standard No.

SJ/T 10143-1991

Language

Chinese, Available in English version

Release Date

1991

Published By

Professional Standard - Electron

Latest

SJ/T 10143-1991

Scope

This standard specifies the "re-entry cavity" test method for the microwave complex dielectric constant of solid dielectric materials. This method is suitable for the measurement of complex dielectric constant of radio frequency and microwave solid dielectrics.

SJ/T 10143-1991 history

• 1991 SJ/T 10143-1991 Detail specification for electronic components--Semiconductor integrated circuits--CT54LS112/CT74LS112 dual J-K negative-edge flip-flop