ASTM E2444-05
Terminology Relating to Measurements Taken on Thin, Reflecting Films

Standard No.

ASTM E2444-05

Release Date

2005

Published By

American Society for Testing and Materials (ASTM)

Status

Be replaced

Replace By

ASTM E2444-05e1

Latest

ASTM E2444-11(2018)

Scope

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

ASTM E2444-05 history

• 2018 ASTM E2444-11(2018) Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films
• 2011 ASTM E2444-11e1 Terminology Relating to Measurements Taken on Thin, Reflecting Films
• 2011 ASTM E2444-11 Terminology Relating to Measurements Taken on Thin, Reflecting Films
• 2005 ASTM E2444-05e1 Terminology Relating to Measurements Taken on Thin, Reflecting Films
• 2005 ASTM E2444-05 Terminology Relating to Measurements Taken on Thin, Reflecting Films