SJ 20719-1998
Method of determination X value for mercury cadmium telluride for use in X-ray fluorimetry (English Version)

Standard No.

SJ 20719-1998

Language

Chinese, Available in English version

Release Date

1998

Published By

Professional Standard - Electron

Latest

SJ 20719-1998

Scope

This standard specifies the use of X-ray fluorescence method to determine the component X value of mercury cadmium telluride wafers. This standard is applicable to the quantitative determination of the X value of mercury cadmium telluride wafer components with an X value in the range of 0.100 ~ 0.350mo1.

SJ 20719-1998 history

• 1998 SJ 20719-1998 Method of determination X value for mercury cadmium telluride for use in X-ray fluorimetry