SJ 3234-1989
Test method for dynamic relating to vacuum gas emission properties of electronic material (English Version)

Standard No.

SJ 3234-1989

Language

Chinese, Available in English version

Release Date

1989

Published By

Professional Standard - Electron

Latest

SJ 3234-1989

Scope

This standard is applicable to the dynamic analysis of the outgassing amount, outgassing rate and outgassing components of electronic materials during thermal desorption in a vacuum environment.

SJ 3234-1989 history

• 1989 SJ 3234-1989 Test method for dynamic relating to vacuum gas emission properties of electronic material