TS 103 254-2016 Methods for Testing and Specification (MTS); TTCN-3 Conformance Test Suite for use of XML schema; Test Suite Structure and Test Purposes (TSS&TP) (V1.2.1)
The purpose of the present document is to provide Test Suite Structure and Test Purposes (TSSTP) for the conformance test suite for using XML Schema with TTCN-3 as defined in ETSI ES 201 873-1 [4]. In the present document only XML related features@ specified in ETSI ES 201 873-9 [1] have been considered but not the core language features (see ETSI ES 201 873-1 [4])@ nor tool implementation (see [i.1] and [i.2])@ language mapping (see [i.3] and [i.4]) and language extension (see e.g. [i.5]@ [i.6] and [i.7]) aspects.
TS 103 254-2016 history
2018TS 103 254-2018 Methods for Testing and Specification (MTS); TTCN-3 Conformance Test Suite for use of XML schema; Test Suite Structure and Test Purposes (TSS&TP) (V1.4.1; Includes Diskette)
2017TS 103 254-2017 Methods for Testing and Specification (MTS); TTCN-3 Conformance Test Suite for use of XML schema; Test Suite Structure and Test Purposes (TSS & TP) (V1.3.1; Includes Diskette)
2016TS 103 254-2016 Methods for Testing and Specification (MTS); TTCN-3 Conformance Test Suite for use of XML schema; Test Suite Structure and Test Purposes (TSS&TP) (V1.2.1)
2015TS 103 254-2015 Methods for Testing and Specifications (MTS); TTCN-3 Conformance Test Suite for use of XML schema; Test Suite Structure and Test Purposes (TSS&TP) (V1.1.1)