SJ/T 11845.3-2022
Reliability evaluation method of electronic components based on low-frequency noise parameters Part 3: Diodes (English Version)

Standard No.

SJ/T 11845.3-2022

Language

Chinese, Available in English version

Release Date

2022

Published By

Professional Standard - Electron

Latest

SJ/T 11845.3-2022

SJ/T 11845.3-2022 history

• 2022 SJ/T 11845.3-2022 Reliability evaluation method of electronic components based on low-frequency noise parameters Part 3: Diodes