OS GSO IEC 60749-23:2014
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Standard No.

OS GSO IEC 60749-23:2014

Published By

GSO

Latest

OS GSO IEC 60749-23:2014

OS GSO IEC 60749-23:2014 history

• 1970 OS GSO IEC 60749-23:2014 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life