ISO 11665-4:2012 Measurement of radioactivity in the environment — Air: radon-222 — Part 4: Integrated measurement method for determining average activity concentration using passive sampling and delayed analysis
This part of ISO 11665 describes radon-222 integrated measurement techniques with passive sampling. It gives indications for determining the average activity concentration of the radon-222 in the air from measurements based on easy-to-use and low-cost passive sampling, and the conditions of use for the sensors.
This part of ISO 11665 covers samples taken without interruption over periods varying from a few days to one year.
This measurement method is applicable to air samples with radon activity concentrations greater than 5 Bq/m3.
ISO 11665-4:2012 Referenced Document
IEC 61577-1:2006 Radiation protection instrumentation - Radon and radon decay product measuring instruments - Part 1: General principles
ISO 11665-1:2012 Measurement of radioactivity in the environment - Air: radon-222 - Part 1: Origins of radon and its short-lived decay products and associated measurement methods
ISO 11929:2010 Determination of the characteristic limits (decision threshold, detection limit and limits of the confidence interval) for measurements of ionizing radiation - Fundamentals and application
ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
ISO 11665-4:2012 history
2021ISO 11665-4:2021 Measurement of radioactivity in the environment - Air: radon-222 - Part 4: Integrated measurement method for determining average activity concentration using passive sampling and delayed analysis
2020ISO 11665-4:2020 Measurement of radioactivity in the environment — Air: radon-222 — Part 4: Integrated measurement method for determining average activity concentration using passive sampling and delayed analysis
2012ISO 11665-4:2012 Measurement of radioactivity in the environment — Air: radon-222 — Part 4: Integrated measurement method for determining average activity concentration using passive sampling and delayed analysis