SJ/T 10739-1996
Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories (English Version)
- Standard No.
- SJ/T 10739-1996
- Language
- Chinese, Available in English version
- Published By
- Professional Standard - Electron
- Status
- 2010-02
- Latest
- SJ/T 10739-1996
SJ/T 10739-1996 history
- 1970 SJ/T 10739-1996 Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories
