This standard specifies a method for measuring the lattice parameters of artificial graphite using X-ray powder diffraction (diffractometer method), and determining the degree of graphitization of artificial graphite through the lattice parameters. This method is suitable for artificial graphite with a high degree of graphitization that has undergone high-temperature heat treatment (such as graphite for artificial diamonds, etc.).
JB/T 4220-1999 history
2011JB/T 4220-2011 Determination method of artificial graphite lattice parameter
1999JB/T 4220-1999 Determination method of artificial graphite lattice parameter