IEEE Std 1671.1-2017
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions

Standard No.

IEEE Std 1671.1-2017

Release Date

2018

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Latest

IEEE Std 1671.1-2017

Replace

IEEE Std 1671.1‐2009

Scope

An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard.

IEEE Std 1671.1-2017 history

• 2018 IEEE Std 1671.1-2017 IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
• 2009 IEEE Std 1671.1-2009 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions