This document defines: 1 A default method for those companies that require a pre-defined approach and 2 A protocol for those companies that wish to develop their own test methods. The default method (Section 4 of the document) is intended for use by electronic equipment manufacturers, repair facilities, or programs which, for a variety of reasons, may be unable to develop methods specific to their own products and applications. It is to be used when little or no other information is available to define, conduct, and interpret results from reliability, qualification, or other tests for electronic equipment containing Pb-free solder. The default method is intended to be conservative, i.e., it is biased toward minimizing the risk to users of AHP electronic equipment.
SAE GEIASTD0005_3A-2018 history
2018SAE GEIASTD0005_3A-2018 Performance Testing for Aerospace and High Performance Electronic Interconnects Containing Pb-free Solder and Finishes
2012SAE GEIASTD0005_3A-2012 Performance Testing for Aerospace and High Performance Electronic Interconnects Containing Pb-free Solder and Finishes (Formerly TechAmerica GEIA-STD-0005-3-REV A)