GSO IEC 62418:2021
Semiconductor devices - Metallization stress void test

Standard No.

GSO IEC 62418:2021

Release Date

2021

Published By

GSO

Latest

GSO IEC 62418:2021

Scope

IEC 62418:2010 describes a method of metallization stress void test and associated criteria. It is applicable to aluminium (Al) or copper (Cu) metallization.

GSO IEC 62418:2021 history

• 2021 GSO IEC 62418:2021 Semiconductor devices - Metallization stress void test