CNS 5751-1980
Method of Test for Apparent Density of Ceramics for Electron Device and Semiconductor Application (English Version)

Standard No.

CNS 5751-1980

Language

Chinese, Available in English version

Release Date

1980

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 5751-1980

Scope

This standard specifies the testing of the apparent density of ceramic parts. This ceramic part is used for electronic components and semiconductor applications. Its maximum size is 25.4 mm, with or without discontinuous pores.

CNS 5751-1980 history

• 1980 CNS 5751-1980 Method of Test for Apparent Density of Ceramics for Electron Device and Semiconductor Application