CNS 5547-1988
Environmental inspection method and durability inspection method of single semiconductor device – high temperature storage test (English Version)

Standard No.

CNS 5547-1988

Language

Chinese, Available in English version

Release Date

1988

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 5547-1988

Scope

This standard specifies test methods for evaluating the ability of a single semiconductor device to withstand long-term high-temperature storage.

CNS 5547-1988 history

• 1988 CNS 5547-1988 Environmental inspection method and durability inspection method of single semiconductor device – high temperature storage test