CNS 6118-1988
Environmental inspection method and durability inspection method of single semiconductor device – low temperature storage test (English Version)
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CNS 6118-1988
Standard No.
CNS 6118-1988
Language
Chinese,
Available in English version
Release Date
1988
Published By
Taiwan Provincial Standard of the People's Republic of China
Latest
CNS 6118-1988
Scope
This standard specifies test methods for the durability of single semiconductor devices when stored at low temperatures.
CNS 6118-1988 history
1988
CNS 6118-1988
Environmental inspection method and durability inspection method of single semiconductor device – low temperature storage test
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