CNS 6560-1980
Measurement of Reverse Recovery Time for Semiconductor Diodes (English Version)

Standard No.

CNS 6560-1980

Language

Chinese, Available in English version

Release Date

1980

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 6560-1980

Scope

This standard specifies the measurement method of reverse recovery time of high-speed diodes, which is applicable to signal diodes below 300ns (for measurement methods with recovery time greater than 300nesec, please refer to CNS_).

CNS 6560-1980 history

• 1980 CNS 6560-1980 Measurement of Reverse Recovery Time for Semiconductor Diodes