IEEE Std 1671.6-2008
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information

Standard No.

IEEE Std 1671.6-2008

Release Date

2013

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Status

Be replaced 2015-05

Replace By

IEEE Std 1671.6-2015

Latest

IEEE Std 1671.6-2015

Scope

An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test.

IEEE Std 1671.6-2008 history

• 2015 IEEE Std 1671.6-2015 IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
• 2013 IEEE Std 1671.6-2008 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information