LST EN 60749-27-2006/A1-2013
Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006/A1:2012)

Standard No.

LST EN 60749-27-2006/A1-2013

Release Date

2013

Published By

Lithuanian Standards Office