IPC/JEDEC J-STD-020D.1-2008
Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices

Standard No.
IPC/JEDEC J-STD-020D.1-2008
Release Date
2008
Published By
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
Replace
JEDEC JESD22-A112 IPC J-STD-020-1996 IPC/JEDEC J-STD-020A-1999 IPC/JEDEC J-STD-020B-2002 IPC/JEDEC J-STD-020C-2004 IPC/JEDEC J-STD-020D-2007 IPC SM-786A-1995 IPC SM-786-1995
Scope
This classification procedure applies to all nonhermetic solid state Surface Mount Devices (SMDs) in packages, which, because of absorbed moisture, could be sensitive to damage during solder reflow. The term SMD as used in this document means plastic encapsulated surface mount packages and other packages made with moisture-permeable materials. The categories are intended to be used by SMD producers to inform users (board assembly operations) of the level of moisture sensitivity of their product devices, and by board assembly operations to ensure that proper handling precautions are applied to moisture/reflow sensitive devices. If no major changes have been made to a previously qualified SMD package, this method may be used for reclassification according to 4.2. This standard cannot address all of the possible component, board assembly and product design combinations. However, the standard does provide a test method and criteria for commonly used technologies. Where uncommon or specialized components or technologies are necessary, the development should include customer/manufacturer involvement and the criteria should include an agreed definition of product acceptance. SMD packages classified to a given moisture sensitivity level by using Procedures or Criteria defined within any previous version of J-STD-020, JESD22-A112 (rescinded), or IPC-SM-786 (rescinded) do not need to be reclassified to the current revision unless a change in classification level or a higher peak classification temperature is desired. Annex B provides an overview of major changes from Revision C to Revision D of this document. Note: If the procedures in this document are used on packaged devices that are not included in this specification’s scope, the failure criteria for such packages must be agreed upon by the device supplier and their end user.



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