BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods. Sealing

Standard No.

BS EN 60749-8:2003

Release Date

2003

Published By

British Standards Institution (BSI)

Latest

BS EN 60749-8:2003

Replace

BS EN 60749:1999

Scope

This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits) The object of this test method is to determine the leak rate of semiconductor devices. NOTE This test is identical to the test method contained in clause 5 of chapter 3 of IEC 60749 (1996), amendment 2, apart from the addition of this clause and clause 2 and the subsequent renumbering.

BS EN 60749-8:2003 history

• 2018 BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
• 2002 BS EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency
• 1999 BS EN 60749:1999 Semiconductor devices - Mechanical and climatic test methods
• 0000 BS 6493-3:1986