NF C96-022-13:2002
Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere.

Standard No.

NF C96-022-13:2002

Release Date

2002

Published By

Association Francaise de Normalisation

Status

Be replaced

Replace By

NF C96-022-13:2018

Latest

NF C96-022-13:2018

Replace

NF C96-022:1999 NF C96-022/A1:2002 NF C96-022/A2:2002

NF C96-022-13:2002 history

• 0000 NF C96-022/A2:2002
• 0000 NF C96-022/A1:2002
• 2002 NF C96-022-9:2002 Semiconductor devices - Mechanical and climatic test methods - Part 9 : permamence of marking.
• 0000 NF C96-022:1999