DLA SMD-5962-96621 REV E-2005
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON

Standard No.
DLA SMD-5962-96621 REV E-2005
Release Date
2005
Published By
Defense Logistics Agency
Scope
This drawing documents three product assurance class levels consisting of high reliability (device classes Q andM), space application (device class V) and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice ofRadiation Hardness Assurance (RHA) levels is reflected in the PIN. For device class T, the user is encouraged to review the manufacturer’s Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application.



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