BS EN 60749-3:2002
Semiconductor devices - Mechanical and climatic test methods - External visual examination

Standard No.

BS EN 60749-3:2002

Release Date

2002

Published By

British Standards Institution (BSI)

Status

Be replaced 2017-11

Replace By

BS EN 60749-3:2017

Latest

BS EN 60749-3:2017

Replace

00/203562 DC-2000 BS EN 60749:1999

Scope

The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance, or both.

BS EN 60749-3:2002 history

• 2018 BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
• 2002 BS EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency
• 1999 BS EN 60749:1999 Semiconductor devices - Mechanical and climatic test methods
• 0000 BS 6493-3:1986