This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on ail exposed surfaces. It is only applicable to those devices specified for a marine environment.
The salt atmosphere test is considered destructive
In general, this salt atmosphere test is in conformity with IEC 60068-2-11 but, due to specific requirements of semiconductors, the clauses of this standard apply.
BS EN 60749-13:2002 history
2018BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
2002BS EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency
1999BS EN 60749:1999 Semiconductor devices - Mechanical and climatic test methods