BS EN 60749-10:2002
Semiconductor devices - Mechanical and climatic test methods - Mechanical shock

Standard No.

BS EN 60749-10:2002

Release Date

2002

Published By

British Standards Institution (BSI)

Latest

BS EN 60749-10:2002

Replace

00/203568 DC-2000 BS EN 60749:1999

Scope

This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. In general, this mechanical shock test is in conformity with IEC 60068-2-27 but, due to specific requirements of semiconductors, the clauses of this standard apply.

BS EN 60749-10:2002 history

• 2018 BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
• 2002 BS EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency
• 1999 BS EN 60749:1999 Semiconductor devices - Mechanical and climatic test methods
• 0000 BS 6493-3:1986