BS EN 60749-7:2002
Semiconductor devices - Mechanical and climatic test methods - Internal moisture content measurement and the analysis of other residual gases

Standard No.

BS EN 60749-7:2002

Release Date

2002

Published By

British Standards Institution (BSI)

Status

Be replaced 2011-09

Replace By

BS EN 60749-7:2011

Latest

BS EN 60749-7:2011

Scope

The purpose of this part of IEC 60749 is to test and measure the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. It can be destructive (Methods 1 and 2) or non-destructive (Method 3).

BS EN 60749-7:2002 history

• 2018 BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
• 2002 BS EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency
• 1999 BS EN 60749:1999 Semiconductor devices - Mechanical and climatic test methods
• 0000 BS 6493-3:1986