(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
Scope
Soft errors are nondestructive functional errors induced by energetic ion strikes. Soft errors are a subset of
single event effects (SEE), and include single-event upsets (SEU), multiple-bit upsets (MBU), singleevent
functional interrupts (SEFI), single-event transients (SET) that, if latched, become SEU, and singleevent
latchup (SEL) where the formation of parasitic bipolar action in CMOS wells induce a lowimpedance
path between power and ground, producing a high current condition (SEL can also cause
latent and hard errors).