JEDEC EIA-435-1976
Measurement of Small-Signal Transistor Scattering Parameters

Standard No.

JEDEC EIA-435-1976

Release Date

1976

Published By

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

Status

Withdraw

Scope

The symbols and terms of this document are contained in JEDEC Publication No. 77 and are not in conflict with those in IEC Publication 147-OC. The measurement procedures are similar to those published in IEC.