JEDEC EIA-398-1972
Measurement of Small Values of Transistor Capacitance

Standard No.
JEDEC EIA-398-1972
Release Date
1972
Published By
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
Status
Scope
Transistor capacitances are usually measured on two-terminal capacitance or impedance bridges. When the capacitances are in the low picofarad ranges, this two terminal measurement is not very accurate or reproducible. The stray capacitances to ground are of the same order of magnitude as the quantities being measured and vary with mechanical changes in the surrounding ground planes.



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