JEDEC EIA-323-1966
Air-Convection-Cooled Life Test Environment for Lead-Mounted Semiconductor Devices

Standard No.

JEDEC EIA-323-1966

Release Date

1966

Published By

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

Scope

This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a Natural-Air-Cooled environment where most (> 90%) of the power dissipation is obtained by convection and radiation losses from the body of the device.