JEDEC JESD22-A117A-2006
Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data Retention Test

Standard No.
JEDEC JESD22-A117A-2006
Release Date
2006
Published By
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
Status
Scope
The following details shall be specified in the applicable device specification and/or the supplier's internal stress test specification, along with the rationale



Copyright ©2024 All Rights Reserved