Content The object of this procedure is to define methods for detecting events that can be as short as 1 nanosecond@ see table 1. Description The methods as described herein are for detection of specimen failure events resulting from short duration large resistance fluctuations@ or voltage variations that may result in improper triggering of high speed digital circuits. Nanosecond duration event detection is considered necessary based on application susceptibilities to noise. This technique is not capable of measuring the duration of an event. Low nanosecond event detection shall not be used as a substitute for the standard 1.0 microsecond requirement. This test was developed to detect different failure mechanisms then those used for he 1.0 microsecond minimum time duration. The number of contacts being monitored in a series circuit will significantly limit the time events possible for detection of a specified event; see 3.1.3.1.2@ Method 1 and 3.2.4.1@ Method 2. Definition An event shall be defined as a voltage increase of a given magnitude that lasts longer than a specified time duration.