KS X ISO 6342-2007(2022)
Micrographics－Aperture cards－Method of measuring thickness of buildup area

Standard No.

KS X ISO 6342-2007(2022)

Release Date

2007

Published By

Korean Agency for Technology and Standards (KATS)

Latest

KS X ISO 6342-2007(2022)

KS X ISO 6342-2007(2022) history

• 0000 KS X ISO 6342-2007(2022)
• 0000 KS X ISO 6342-2007(2017)
• 2007 KS X ISO 6342:2007 Micrographics－Aperture cards－Method of measuring thickness of buildup area
• 0000 KS X ISO 6342:2004