BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test
- Standard No.
- BS EN IEC 60749-5:2024
- Release Date
- 2024
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN IEC 60749-5:2024
- Scope
- This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test method is considered destructive.
BS EN IEC 60749-5:2024 Referenced Document
- IEC 60749-4 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
BS EN IEC 60749-5:2024 history
- 2024 BS EN IEC 60749-5:2024 Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test
Standard and Specification
BS EN 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Steady-state temperature humidity bias life test
IEC 60749-5:2023 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60749-5:2023 RLV Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
BS EN 60749-5:2017 devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test
GSO IEC 60749-5:2014 devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
DS/EN 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
EN 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test