IEEE P1505.1/D6-2019
Standard for the Common Test Interface Pin Map Configuration for High-Density@ Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

Standard No.

IEEE P1505.1/D6-2019

Release Date

2019

Published By

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

Scope

The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505? Receiver Fixture Interface (RFI). The pin map defined within this standard shall apply to military and Aerospace Automatic Test Equipment (ATE) testing applications. Purpose Permits the physical interoperability of IEEE-1505 compliant interface fixtures [also known as interface test adapters@ interface devices@ or interconnecting devices] on multiple ATE systems utilizing the IEEE 1505 Receiver Fixture Interface by providing a standardized physical pin map with related connector configuration and contact performance characteristics.