IEEE P1671.1/D2, April 2017
IEEE Draft Standard for Automatic Test Markup Language (ATML) Test Description

Standard No.
IEEE P1671.1/D2, April 2017
Release Date
2017
Published By
Institute of Electrical and Electronics Engineers (IEEE)
Scope
An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard.



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