IEEE 1671 SERIES-2010
Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

Standard No.
IEEE 1671 SERIES-2010
Release Date
2010
Published By
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
Scope
ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data@ resource data@ diagnostic data@ and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards. Purpose The purpose of ATML is to support TP@ test asset@ and UUT interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT@ test@ and diagnostic information between components of the test system. The purpose of this standard is to provide an overview of ATML goals@ define the ATML family of standards@ and specify common data elements for the ATML family of standards.



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